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Grant: Discovery Grants Program - Individual

York University

$45,000.00

Study of the formation of thin films materials and their properties

FY 2011-12

Summary
There is a strong drive in the scientific community to control matter on the nanometer length scale that is at the level of atoms, molecules, and supramolecular structures to create useful materials, devices and systems for application in nanotechnology. Chemists have contributed greatly to this area by proposing new ways to assemble, pattern and incorporate molecules and materials that can have potential impact on the cost, speed and quality of the next generation of electronic devices such as chips, hard drive memory and energy efficient monitors. Our research program deals in one way or another with low dimensionality systems and the importance of changes in material properties due to the modification of their surface. The first objective of this research program is to produce and characterize functional films on silicon surfaces. Wet chemistry on silicon surfaces was shown to be particular well suited for future integration in nanotechnology's ""bottom-up"" fabrication strategy. The approach taken in our work shows promises in creating good quality films that can then be used for property characterizations and device fabrication. This is paramount since the first concern of colleagues interested in applications for these materials is related to the presence of oxide at the silicon surface. The presence of silicon oxide impurities will have a great impact on the future device performance. Ultimately we wish to understand the formation of these materials and to relate their structures and morphology to their electrochemical/electronic properties.
Program
Discovery Grants Program - Individual
Location
Ontario, Canada
Recipient Type
Academia
Type
Grant
Source
NSERC's Awards Data

As published

Application id
222929-2007
Name nom
Morin, Sylvie
Department département
Chemistry
Organization id
38
Institution établissement
York University
Province en
Ontario
Province fr
Ontario
Country en
CANADA
Country fr
CANADA
Fiscal year exercice financier
2011
Competition year année de concours
2007
Award amount
45000
Program id
RGPIN
Program nane en
Discovery Grants Program - Individual
Program name fr
Programme de subventions à la découverte - individuelles
Group en
Discovery grants programs
Group fr
Programmes de subventions à la découverte
Committee code
26
Committee name en
Anal. & Phys. Chemistry
Committee name fr
Chimie analytique et physique
Area of application code
1208
Area of application group en
Advancement of knowledge
Area of application group fr
Avancement des connaissances
Area of application en
Materials sciences
Area of application fr
Sciences des matériaux
Research subject code
3402
Research subject group en
Physical chemistry
Research subject group fr
Chimie physique
Research subject en
Surface and interfacial chemistry
Research subject fr
Chimie des surfaces et des interfaces
Partie
5
Nb partie
8
Application title
Study of the formation of thin films materials and their properties
Keyword
NSERC
Application summary
There is a strong drive in the scientific community to control matter on the nanometer length scale that is at the level of atoms, molecules, and supramolecular structures to create useful materials, devices and systems for application in nanotechnology. Chemists have contributed greatly to this area by proposing new ways to assemble, pattern and incorporate molecules and materials that can have potential impact on the cost, speed and quality of the next generation of electronic devices such as chips, hard drive memory and energy efficient monitors. Our research program deals in one way or another with low dimensionality systems and the importance of changes in material properties due to the modification of their surface. The first objective of this research program is to produce and characterize functional films on silicon surfaces. Wet chemistry on silicon surfaces was shown to be particular well suited for future integration in nanotechnology's ""bottom-up"" fabrication strategy. The approach taken in our work shows promises in creating good quality films that can then be used for property characterizations and device fabrication. This is paramount since the first concern of colleagues interested in applications for these materials is related to the presence of oxide at the silicon surface. The presence of silicon oxide impurities will have a great impact on the future device performance. Ultimately we wish to understand the formation of these materials and to relate their structures and morphology to their electrochemical/electronic properties.
York University - $45,000 Grant (2011-12) | Canada Spends