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Grant: Research Tools and Instruments - Category 1 (<$150,000)

University of Waterloo

$148,734.00

Characterization Test Bench for X-ray Detectors

FY 2014-15

Summary
The University of Waterloo is an international leader in digital X-ray technology having facilitated the invention of, among other devices, one of the world's highest-spatial-resolution digital X-ray imager having a pixel pitch of just 6 microns, more then 10X smaller than a comparable commercially available state-of-the-art X-ray imaging device. New applications are poised to emerge for this ultra-high resolution X-ray imager in fields such as macromolecular crystallography, medical imaging, non-destructive testing of semiconductor components, and biotech research. Key leaders at the Canadian Light Source (CLS) beam line and the U.S. National Labs synchrotron facility have already expressed keen interest in using these high-resolution detectors to explore new applications. This proposal requests specific, custom tools capable of characterizing these high resolution digital X-ray imagers during the engineering prototype development phase as well for characterizing other novel X-ray imager technology under development at Waterloo including mechanically flexible, low dose and low cost X-ray imagers. The characterization equipment will be housed in the university-level Giga-to-Nanoelectronics (G2N) facility and will be accessible to all G2N lab users (45 annually from across ten departments) as well as local hospitals and prominent local digital imaging industry such as Teledyne DALSA and ON Semiconductor. The PI and co-applicants are training over 30 HQPs annually and it is expected that at least half of these will be trained annually on X-ray and digital imager characterization using the proposed infrastructure. To date, graduates from the relevant research programs have found employment at Teledyne DALSA, GE Healthcare, Apple, ON Semiconductor, US FDA, Omnivision, Christie Digital, Ignis, and two have started their own company.
Program
Research Tools and Instruments - Category 1 (<$150,000)
Location
Ontario, Canada
Recipient Type
Academia
Type
Grant
Source
NSERC's Awards Data

As published

Application id
472479-2015
Name nom
Karim, KarimSallaudin
Department département
Electrical & Computer Engineering
Organization id
33
Institution établissement
University of Waterloo
Province en
Ontario
Province fr
Ontario
Country en
CANADA
Country fr
CANADA
Fiscal year exercice financier
2014
Competition year année de concours
2015
Award amount
148734
Program id
EQPEQ
Program name en
Research Tools and Instruments - Category 1 (<$150,000)
Program name fr
Outils et instruments de recherche - catégorie 1 (<150 000$)
Group en
Discovery grants programs
Group fr
Programmes de subventions à la découverte
Committee code
1510
Committee name en
Electrical and Computer Engineering
Committee name fr
Génie électrique et informatique
Area of application code
500
Area of application group en
Manufacturing processes and products
Area of application group fr
Procédés et produits industriels
Area of application en
Manufacturing processes and products
Area of application fr
Procédés et produits industriels
Research subject code
2523
Research subject group en
Electrical and electronic engineering
Research subject group fr
Génie électrique et électronique
Research subject en
Semiconductor fabrication and packaging
Research subject fr
Fabrication et mise sous enveloppe de semi-conducteurs
Partie
1
Nb partie
1
Application title
Characterization Test Bench for X-ray Detectors
Keyword
NSERC
Application summary
The University of Waterloo is an international leader in digital X-ray technology having facilitated the invention of, among other devices, one of the world's highest-spatial-resolution digital X-ray imager having a pixel pitch of just 6 microns, more then 10X smaller than a comparable commercially available state-of-the-art X-ray imaging device. New applications are poised to emerge for this ultra-high resolution X-ray imager in fields such as macromolecular crystallography, medical imaging, non-destructive testing of semiconductor components, and biotech research. Key leaders at the Canadian Light Source (CLS) beam line and the U.S. National Labs synchrotron facility have already expressed keen interest in using these high-resolution detectors to explore new applications. This proposal requests specific, custom tools capable of characterizing these high resolution digital X-ray imagers during the engineering prototype development phase as well for characterizing other novel X-ray imager technology under development at Waterloo including mechanically flexible, low dose and low cost X-ray imagers. The characterization equipment will be housed in the university-level Giga-to-Nanoelectronics (G2N) facility and will be accessible to all G2N lab users (45 annually from across ten departments) as well as local hospitals and prominent local digital imaging industry such as Teledyne DALSA and ON Semiconductor. The PI and co-applicants are training over 30 HQPs annually and it is expected that at least half of these will be trained annually on X-ray and digital imager characterization using the proposed infrastructure. To date, graduates from the relevant research programs have found employment at Teledyne DALSA, GE Healthcare, Apple, ON Semiconductor, US FDA, Omnivision, Christie Digital, Ignis, and two have started their own company.
University of Waterloo - $148,734 Grant (2014-15) | Canada Spends