Grant: Discovery Grants Program - Individual
University of Saskatchewan
$59,000.00
Amorphous Semiconductors for Optoelectronic Applications: Photodetectors & X-Ray Detectors Based on Multilayer Doped Selenium-Alloys
FY 2024-25
Summary
The current DG program is on amorphous semiconductors for x-ray detector applications with the present extension being solely on multilayer doped amorphous selenium (a-Se) alloys. a-Se alloys have one clear distinct advantage over crystalline semiconductors that they can be conveniently fabricated over large areas, which has led to their extensive commercial use in flat panel x-ray imaging detectors. Over 70% of mammographic x-ray detectors today use a-Se based technologies. Furthermore, a-Se is the only large area semiconductor so far that exhibits avalanche multiplication under sufficiently high fields. This enables avalanche a-Se detectors to be used in indirect conversion with a suitable scintillator, which opens up the chess radiology modality to a-Se detectors. The long-term objective is to extend our scientific and technological knowledge on doped a-Se alloy-based semiconductors and devices by discoveries at the material and device levels; and advancing knowledge at the fundamental level. The design of third generation a-Se detectors, in particular for use in general radiology, CT and tomosynthesis needs extensive knowledge of the electrical properties of the photoconductor, i.e. drift mobilities, carrier lifetimes, sensitivity, dark current, excess noise, avalanche multiplication noise, thermal generation rate, x-ray induced effects and relaxation effects - a-Se alloys exhibit relaxation effects over time. Although much progress has been achieved in the last DG cycle, there is still much left to be discovered. The DG program will encompass all aspects of photoconductor research from present to new a-Se alloys (doped and alloyed) in a concerted effort to relate detector performance to fundamental semiconductor properties through physical models: (A) The study of optoelectronic properties of new doped a-Se alloys as a function of temperature and electric field toward enhanced n-i-p structures, avalanche a-Se photodetectors, and novel vertical a-Se detectors that can be used at high energies and also potentially in dual energy imaging (B) The study of excess or flicker noise (or 1/f noise) in various a-Se structures as a function of applied field, temperature, device configuration, and pre-irradiation. (C) The development of new noise models for a-Se detectors towards improved detective quantum efficiency (DQE) models. Unfortunately, very little is known on the excess noise due to the dark current in a-Se alloy-based detectors (the shot noise assumption in the literature is wrong), which will be investigated in this work. The DG program will investigate halogen-doped a-Se1-xTex alloys whose bandgap can be matched to the emission wavelength of the scintillator and hence can enable high DQE large area indirect conversion detectors over all modalities. The results will be directly useful to the Canadian x-ray detector industry and to the advancement of x-ray diagnosis in health care; and enhanced industrial and security imaging as well.
Program
Discovery Grants Program - Individual
Recipient
Location
Saskatchewan, Canada
Recipient Type
Academia
Type
Grant
Source
NSERC's Awards Data
As published
Application id
RGPIN-2023-04241
Name nom
Kasap, Safa
Department département
Electrical & Computer Engineering - Electrical & Computer Engineering
Organization id
16
Institution établissement
University of Saskatchewan
Province en
Saskatchewan
Province fr
Saskatchewan
Country en
CANADA
Country fr
CANADA
Fiscal year exercice financier
2024
Competition year année de concours
2023
Award amount
59000
Program id
RGPIN
Program name en
Discovery Grants Program - Individual
Program name fr
Programme de subventions à la découverte - individuelles
Group en
DISCOVERY RESEARCH
Group fr
RECHERCHE AXÉE SUR LA DÉCOUVERTE
Committee code
1510
Committee name en
Electrical and Computer Engineering
Committee name fr
Génie électrique et informatique
Area of application code
513
Area of application group en
Manufacturing processes and products
Area of application group fr
Procédés et produits industriels
Area of application en
Electrical and electronic machinery and equipment (including computer hardware)
Area of application fr
Machinerie et équipement électriques et électroniques (y compris matériel informatique)
Research subject code
2500
Research subject group en
Electrical and electronic engineering
Research subject group fr
Génie électrique et électronique
Research subject en
Electrical and electronic engineering
Research subject fr
Génie électrique et électronique
Field of research list names en
Not available
Field of research list names fr
Non disponible
Socioeconomic objective list names en
Not available
Socioeconomic objective list names fr
Non disponible
Application title
Amorphous Semiconductors for Optoelectronic Applications: Photodetectors & X-Ray Detectors Based on Multilayer Doped Selenium-Alloys
Keywords
amorphous semiconductors; photoconductors; sensors; photodetectors; x-ray detectors; selenium-alloys (doped); large area x-ray imaging detectors; excess electronic noise in devices; fabrication & characterization (devices); x-ray induced damage
Application summary
The current DG program is on amorphous semiconductors for x-ray detector applications with the present extension being solely on multilayer doped amorphous selenium (a-Se) alloys. a-Se alloys have one clear distinct advantage over crystalline semiconductors that they can be conveniently fabricated over large areas, which has led to their extensive commercial use in flat panel x-ray imaging detectors. Over 70% of mammographic x-ray detectors today use a-Se based technologies. Furthermore, a-Se is the only large area semiconductor so far that exhibits avalanche multiplication under sufficiently high fields. This enables avalanche a-Se detectors to be used in indirect conversion with a suitable scintillator, which opens up the chess radiology modality to a-Se detectors. The long-term objective is to extend our scientific and technological knowledge on doped a-Se alloy-based semiconductors and devices by discoveries at the material and device levels; and advancing knowledge at the fundamental level. The design of third generation a-Se detectors, in particular for use in general radiology, CT and tomosynthesis needs extensive knowledge of the electrical properties of the photoconductor, i.e. drift mobilities, carrier lifetimes, sensitivity, dark current, excess noise, avalanche multiplication noise, thermal generation rate, x-ray induced effects and relaxation effects - a-Se alloys exhibit relaxation effects over time. Although much progress has been achieved in the last DG cycle, there is still much left to be discovered. The DG program will encompass all aspects of photoconductor research from present to new a-Se alloys (doped and alloyed) in a concerted effort to relate detector performance to fundamental semiconductor properties through physical models: (A) The study of optoelectronic properties of new doped a-Se alloys as a function of temperature and electric field toward enhanced n-i-p structures, avalanche a-Se photodetectors, and novel vertical a-Se detectors that can be used at high energies and also potentially in dual energy imaging (B) The study of excess or flicker noise (or 1/f noise) in various a-Se structures as a function of applied field, temperature, device configuration, and pre-irradiation. (C) The development of new noise models for a-Se detectors towards improved detective quantum efficiency (DQE) models. Unfortunately, very little is known on the excess noise due to the dark current in a-Se alloy-based detectors (the shot noise assumption in the literature is wrong), which will be investigated in this work. The DG program will investigate halogen-doped a-Se1-xTex alloys whose bandgap can be matched to the emission wavelength of the scintillator and hence can enable high DQE large area indirect conversion detectors over all modalities. The results will be directly useful to the Canadian x-ray detector industry and to the advancement of x-ray diagnosis in health care; and enhanced industrial and security imaging as well.