Grant: Collaborative Research and Development Grants
University of British Columbia
$93,000.00
Design, verification, and test of analog and mixed-signal integrated circuits with an emphasis on PLLs
FY 2014-15
Summary
Analog and mixed-signal (AMS) integrated circuits present post-silicon (post-Si) validation challenges becauseof the inherent limited controllability and observability of internal signals. Furthermore, the lack of rigorousspecifications complicates the debug process because it can be difficult to determine if the response of aparticular internal block is wrong or if it is only different than the responses that were observed in pre-Sisimulations. While large chips are making more and more use of AMS blocks, the analog circuits themselvesare becoming increasingly digital. Designers frequently use ""digitally assisted techniques"" to cope with theshortcomings of analog performance of the devices in advanced CMOS technologies by either augmenting theanalog circuits with digital blocks or, when possible, by replacing them. For example, traditional phase-lockedloops (PLLs) are giving way to predominantly digital designs with a minimum number of analog blocks,namely, the controllable oscillator, to limit the impact of device variability on the circuit. Furthermore,feedback control loops are ubiquitous in analog designs to compensate for process parameter, power supplyvoltage, and temperature (PVT) variations, adjust timing deskew, implement temperature regulation, etc. Thesecontrol loops are almost always implemented using digital hardware or with software running on an embeddedmicrocontroller. From this perspective, most AMS designs consist of a few analog blocks embedded in digitalcontrol loops. We observe that most of these control loops are based on simple controller designs such asproportional-integral (PI) controllers. Likewise, we observe that most analog blocks have simple responses,when viewed in the appropriate domains. By viewing AMS circuits as analog blocks embedded in digitalcontrollers, the objective of this research is to obtain a generic structure for AMS circuits (with an emphasis onPLLs) that can be leveraged for pre-Si verification and post-Si debug and validation. We propose varioustechniques for design, verification, and test of AMS integrated circuits and confirm the validity of thetechniques using proof-of-concept prototype integrated circuits implemented in advanced CMOS technologies.
Program
Collaborative Research and Development Grants
Recipient
Location
British Columbia, Canada
Recipient Type
Academia
Type
Grant
Source
NSERC's Awards Data
As published
Application id
451560-2013
Name nom
Mirabbasi, Shahriar
Department département
Electrical and Computer Engineering
Organization id
2
Institution établissement
University of British Columbia
Province en
British Columbia
Province fr
Colombie-Britannique
Country en
CANADA
Country fr
CANADA
Fiscal year exercice financier
2014
Competition year année de concours
2013
Award amount
93000
Program id
CRDPJ
Program name en
Collaborative Research and Development Grants
Program name fr
Subventions de recherche et développement coopérative
Group en
Research partnerships programs
Group fr
Programmes de partenariat
Committee code
96
Committee name en
RPP Internal Decision Cttee
Committee name fr
Cté de décision interne - PPR
Area of application code
1207
Area of application group en
Advancement of knowledge
Area of application group fr
Avancement des connaissances
Area of application en
Information, computer and communication technologies
Area of application fr
Technologie de l'information, des ordinateurs et des réseaux de communications
Research subject code
2504
Research subject group en
Electrical and electronic engineering
Research subject group fr
Génie électrique et électronique
Research subject en
Integrated circuits
Research subject fr
Circuits intégrés
Partie
2
Nb partie
3
Application title
Design, verification, and test of analog and mixed-signal integrated circuits with an emphasis on PLLs
Keyword
NSERC
Application summary
Analog and mixed-signal (AMS) integrated circuits present post-silicon (post-Si) validation challenges becauseof the inherent limited controllability and observability of internal signals. Furthermore, the lack of rigorousspecifications complicates the debug process because it can be difficult to determine if the response of aparticular internal block is wrong or if it is only different than the responses that were observed in pre-Sisimulations. While large chips are making more and more use of AMS blocks, the analog circuits themselvesare becoming increasingly digital. Designers frequently use ""digitally assisted techniques"" to cope with theshortcomings of analog performance of the devices in advanced CMOS technologies by either augmenting theanalog circuits with digital blocks or, when possible, by replacing them. For example, traditional phase-lockedloops (PLLs) are giving way to predominantly digital designs with a minimum number of analog blocks,namely, the controllable oscillator, to limit the impact of device variability on the circuit. Furthermore,feedback control loops are ubiquitous in analog designs to compensate for process parameter, power supplyvoltage, and temperature (PVT) variations, adjust timing deskew, implement temperature regulation, etc. Thesecontrol loops are almost always implemented using digital hardware or with software running on an embeddedmicrocontroller. From this perspective, most AMS designs consist of a few analog blocks embedded in digitalcontrol loops. We observe that most of these control loops are based on simple controller designs such asproportional-integral (PI) controllers. Likewise, we observe that most analog blocks have simple responses,when viewed in the appropriate domains. By viewing AMS circuits as analog blocks embedded in digitalcontrollers, the objective of this research is to obtain a generic structure for AMS circuits (with an emphasis onPLLs) that can be leveraged for pre-Si verification and post-Si debug and validation. We propose varioustechniques for design, verification, and test of AMS integrated circuits and confirm the validity of thetechniques using proof-of-concept prototype integrated circuits implemented in advanced CMOS technologies.