Grant: Collaborative Research and Development Grants

Since its invention by Ernst Ruska and Max Knoll (ca. 1930), a handful of companies specialized in the development and fabrication of transmission electron microscopes, whereas others focused on manufacturing peripheral devices. However, this trend has changed. Nowadays, electron microscopy companies are trying to gain control on the cost and quality of their electron microscope accessories to offer customers a more attractive, complete, and reliable instrument with centralized support.This proposal partners Hitachi, a world-leading High Tech company, with the Ultrafast electron Imaging Lab (UeIL) at the University of Waterloo, a laboratory that specializes in state-of-the-art instrumentation development, to produce an exclusive electron detection system designed to suit Hitachi transmission electron microscopes. Hitachi High Technologies has a wide portfolio of high-tech products that range from analytical systems, electron and atomic force microscopes, semiconductor manufacturing equipment, and a large variety of industry-targeted instruments but electron detection cameras. This development plan therefore represents a unique opportunity to synergize collaborative work between UeIL and Hitachi High Technologies Canada Inc. to generate a robust and cost effective retractable electron detection device. Furthermore, this newly developed electron camera will be fully integrated with ""Maestro"": a centralized computer platform developed by Hitachi High Technologies to control all auxiliary devices in Hitachi electron microscopes.