Grant: Research Tools and Instruments - Category 1 (<$150,000)

This minor equipment application seeks the support for a critical replacement of a broken Atomic Force Microscope (AFM) and Nanolithography system at the University of Waterloo. Equipped with multiple techniques, including Tunnelling AFM and Scanning Surface Resistance Microscopy, in-liquid imaging, and nanolithography, this Nanoscope IV NanoMan AFM system represented one of the best commercial AFM instruments in the world. The Waterloo machine was also one of the very few AFM systems in Canada that were capable of not just nanolithography but also the aforementioned nanoprobing techniques with nanoscale resolution. This AFM system has been in operation since early 2003 and has been under heavy use, serving the research needs of over 15 local research groups from the University of Waterloo and 7 groups from other Canadian universities. In late 2009, this system has suffered devastating damages by a series of power interruptions during a thunderstom. With the manufacturer recently decided to terminate support of this generation of AFM systems, this effectively rules out any repair option and leaves us no choice but to apply for a replacement system. Specifically, the requested support will allow us to replace this AFM system with similar capabilities. This critical replacement will bring the Waterloo AFM facility back up to full operation, with its superior performance in imaging, nanolithography, and other nanoprobing techniques. The requested replacement system is critically needed for the continued survival of the diverse materials science and engineering research programs at Waterloo, and over 35 graduate thesis projects depend on this instrument.