Grant: Discovery Grants Program - Individual
Memorial University of Newfoundland
$22,000.00
Experimental and Numerical Studies of Cantilever Sensors
EF 2021-22
Résumé
Atomic Force Microscopy; Cantilever Sensors; Environmental Monitoring; Fluid Dynamics Simulations; Fresh Water; Frictional Force Microscopy; Heavy Metals; Microcantilevers; Scanning Tunneling Microscopy; Thin Films
Programme
Discovery Grants Program - Individual
Bénéficiaire
Emplacement
Newfoundland and Labrador, Canada
Type de bénéficiaire
Academia
Type
Grant
Source
NSERC's Awards Data
Tel que publié
Application id
RGPIN-2016-04702
Name nom
Beaulieu, Luc
Department département
Physics and Physical Oceanography
Organization id
89
Institution établissement
Memorial University of Newfoundland
Province en
Newfoundland and Labrador
Province fr
Terre-Neuve-et-Labrador
Country en
CANADA
Country fr
CANADA
Fiscal year exercice financier
2021
Competition year année de concours
2016
Award amount
22000
Program id
RGPIN
Program name en
Discovery Grants Program - Individual
Program name fr
Programme de subventions à la découverte - individuelles
Group en
Discovery grants programs
Group fr
Programmes de subventions à la découverte
Committee code
1505
Committee name en
Physics
Committee name fr
Physique
Area of application code
1208
Area of application group en
Advancement of knowledge
Area of application group fr
Avancement des connaissances
Area of application en
Materials sciences
Area of application fr
Sciences des matériaux
Research subject code
3303
Research subject group en
Condensed matterphysics
Research subject group fr
Physique de la matière condensée
Research subject en
Surfaces, interfaces and thin films
Research subject fr
Surfaces, interfaces et couches minces
Installment
inst:5
Partie
1
Nb partie
6
Application title
Experimental and Numerical Studies of Cantilever Sensors
Keyword
NSERC
Application summary
Atomic Force Microscopy; Cantilever Sensors; Environmental Monitoring; Fluid Dynamics Simulations; Fresh Water; Frictional Force Microscopy; Heavy Metals; Microcantilevers; Scanning Tunneling Microscopy; Thin Films