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Grant: Collaborative Research and Development Grants

University of Saskatchewan

$58,500.00

Study soft errors in ternary content addressable memories and DC-DC converters

EF 2012-13

Résumé
Over the last four decades, silicon technology scaling has remarkably improved the integrated circuits (ICs) by increasing the transistor density and operating frequency while reducing the cost and energy consumption per transistor. However, scaling in the sub-65 nanometer regime has brought a number of reliability issues. In particular, the scaling of silicon technologies makes ICs more vulnerable to single event effects (SEEs) induced by energetic particles. In a well-designed IC, soft errors induced by SEEs appear to be the most troublesome both in terrestrial and high altitude or space environment. In this proposal, we will study soft errors in Ternary Content Addressable Memories (TCAM) and DC-DC converter controllers using pulsed lasers and computer simulation tools. Soft errors in TCAM can be significant, since generally TCAMs do not make use of some of the fault-tolerant techniques to mitigate soft errors due to tight physical limitations. In addition, the power-ground bouncing noise during search operations can increase the sensitivity of ICs to SEEs. Soft errors in a DC-DC controller can reset the up-level system and cause significant failures. Pulsed laser beams will be used to inject the transient faults to the devices since the laser can be focused to a small spot on the areas of interest and scanned across the device, which provides more information than the much broader ion beams. Device and schematic simulation tools will be used for the investigation, so that cost-effective SEE mitigation methods can be developed. The research poject will result in patentable technologies and publications in related journals and conferences. The Canadian industry partner (Cisco Canada) can adopt the technologies developed from this project to improve the reliability of their produces such as switches and linecards. The project will also enhance the capability and expertise of the research group in the area of microelectronics reliability at the University of Saskatchewan. During this project period, a two-photon absorption laser facility will be established, which will be the first functional one in Canada to carry out this kind of research. Two graduate students will be trained to advance the technology and to work closely with the industrial partners.
Programme
Collaborative Research and Development Grants
Emplacement
Saskatchewan, Canada
Type de bénéficiaire
Academia
Type
Grant
Source
NSERC's Awards Data

Tel que publié

Application id
436499-2012
Name nom
Chen, Li
Department département
Electrical & Computer Engineering
Organization id
16
Institution établissement
University of Saskatchewan
Province en
Saskatchewan
Province fr
Saskatchewan
Country en
CANADA
Country fr
CANADA
Fiscal year exercice financier
2012
Competition year année de concours
2012
Award amount
58500
Program id
CRDPJ
Program name en
Collaborative Research and Development Grants
Program name fr
Subventions de recherche et développement coopérative
Group en
Research partnerships programs
Group fr
Programmes de partenariat
Committee code
96
Committee name en
RPP Internal Decision Cttee
Committee name fr
Cté de décision interne - PPR
Area of application code
513
Area of application group en
Manufacturing processes and products
Area of application group fr
Procédés et produits industriels
Area of application en
Electrical and electronic machinery and equipment (including computer hardware)
Area of application fr
Machinerie et équipement électriques et électroniques (y compris matériel informatique)
Research subject code
2506
Research subject group en
Electrical and electronic engineering
Research subject group fr
Génie électrique et électronique
Research subject en
Electron devices
Research subject fr
Dispositifs électroniques
Partie
1
Nb partie
2
Application title
Study soft errors in ternary content addressable memories and DC-DC converters
Keyword
NSERC
Application summary
Over the last four decades, silicon technology scaling has remarkably improved the integrated circuits (ICs) by increasing the transistor density and operating frequency while reducing the cost and energy consumption per transistor. However, scaling in the sub-65 nanometer regime has brought a number of reliability issues. In particular, the scaling of silicon technologies makes ICs more vulnerable to single event effects (SEEs) induced by energetic particles. In a well-designed IC, soft errors induced by SEEs appear to be the most troublesome both in terrestrial and high altitude or space environment. In this proposal, we will study soft errors in Ternary Content Addressable Memories (TCAM) and DC-DC converter controllers using pulsed lasers and computer simulation tools. Soft errors in TCAM can be significant, since generally TCAMs do not make use of some of the fault-tolerant techniques to mitigate soft errors due to tight physical limitations. In addition, the power-ground bouncing noise during search operations can increase the sensitivity of ICs to SEEs. Soft errors in a DC-DC controller can reset the up-level system and cause significant failures. Pulsed laser beams will be used to inject the transient faults to the devices since the laser can be focused to a small spot on the areas of interest and scanned across the device, which provides more information than the much broader ion beams. Device and schematic simulation tools will be used for the investigation, so that cost-effective SEE mitigation methods can be developed. The research poject will result in patentable technologies and publications in related journals and conferences. The Canadian industry partner (Cisco Canada) can adopt the technologies developed from this project to improve the reliability of their produces such as switches and linecards. The project will also enhance the capability and expertise of the research group in the area of microelectronics reliability at the University of Saskatchewan. During this project period, a two-photon absorption laser facility will be established, which will be the first functional one in Canada to carry out this kind of research. Two graduate students will be trained to advance the technology and to work closely with the industrial partners.