Grant: Research Tools and Instruments - Category 1 (<$150,000)

Miniaturization of products in a wide range of sectors including biomedical, electronics, and aerospace applications have dramatically increased the need to fabricate complex 3D parts with features smaller than a micron to a high relative accuracy in a diverse set of materials including stainless steel, titanium, ceramics, polymers, etc. The research program at the Laboratory of Advanced Multiscale Manufacturing (LAMM) focuses on understanding, modeling, and developing micromachining processes and systems particularly suitable for precision machining of 3D components with a variety of geometries and features at the micro/nano-scale. For improved performance of emerging miniaturized products, cost-effective batch production and accuracy of small parts plays a critical role in success of the product in the market. Proper understanding and modeling of the micromachining processes are required to achieve the optimum process conditions for better accuracy and surface quality. Development and optimization of effective process plans and process control systems as well as a machinability database for a wide range of engineering materials are also critical for cost-effective and automated batch production of a given part. Currently, the research program concentrates on mechanical micro-milling and femtosecond laser machining processes. With increasing miniaturization, 3-dimensional measurement of small parts becomes extremely important. Scanning electron microscopes (SEM) or high quality optical microscopes are effective in visualization of micro-features but typically limited to much smaller than 1 mm size working area. Dimension and surface quality measurements are also quite difficult with SEM or optical microscopes. For the research program at LAMM in precision micromachining of 3D components, it is essential to verify dimensions and surface quality. Currently, an optical profiler system is the only effective method available in the market. Optical profiler is an optical 3D measurement device that combines the functionalities of a surface measurement system and a micro coordinate system in one measurement device. Therefore, an optical profiler is requested in this proposal.