Grant: Discovery Grants Program - Individual
University of Saskatchewan
$71,500.00
Amorphous semiconductors for optoelectronic applications: photoconductors, detectors and sensors based on se-alloys
EF 2011-12
Résumé
Amorphous semiconductors, such as hydrogenated amorphous silicon (a-Si:H) and its alloys, amorphous selenium (a-Se) and its alloys (a-Se:As) etc, have one clear distinct advantage over crystalline semiconductors that they can be conveniently fabricated over large areas, which has lead to their extensive commercial use in photovoltaics, flat panel displays (TFT displays), flat panel x-ray image detectors, and flexible electronics. Within the field of electronic and optoelectronic devices, amorphous semiconductors represent a particularly important niche in which Canada has a very strong and competitive presence. Our long term goals and objectives are to build on strength by expanding our scientific and technological knowledge on a-Se alloy based semiconductors and optoelectronic devices by innovation at the material level, innovation at the device level and advancing knowledge at the fundamental level. The design of next generation a-Se x-ray image detectors also needs extensive knowledge on the electrical properties of the photoconductor used in the three layers, e.g. charge carrier ranges, drift mobility x carrier lifetime, excess noise and thermal generation rate in each layer. To date, no one has examined the nature of electronic noise in a-Se p-i-n detectors and we intend to take this on as a major study. Our objectives and studies will include: (i) Discovering and understanding the electrical and optoelectronic properties of a-Se:As alloys as a function of temperature and electric field toward enhanced p-i-n structures with lower dark currents and higher applied fields; increasing the field will improve the DQE. (ii) Discovering the behavior of low-frequency (1/f) noise for better detector design. (iii) More stable compositions for the i-layer and p-layer through enhanced material properties from (i). (iv) Developing avalanche a-Se structures with multiplication, demonstrating their suitability for use in ultrasensitive optical imaging and in indirect radiation detection. The impact of the work is, of course, the generation of new knowledge on a-Se detectors, novel structures with new compositions, for the design and development of next generation a-Se x-ray detectors, and all solid state ultrasenstive optical image sensors.
Programme
Discovery Grants Program - Individual
Bénéficiaire
Emplacement
Saskatchewan, Canada
Type de bénéficiaire
Academia
Type
Grant
Source
NSERC's Awards Data
Tel que publié
Application id
4046-2011
Name nom
Kasap, Safa
Department département
Electrical & Computer Engineering
Organization id
16
Institution établissement
University of Saskatchewan
Province en
Saskatchewan
Province fr
Saskatchewan
Country en
CANADA
Country fr
CANADA
Fiscal year exercice financier
2011
Competition year année de concours
2011
Award amount
71500
Program id
RGPIN
Program nane en
Discovery Grants Program - Individual
Program name fr
Programme de subventions à la découverte - individuelles
Group en
Discovery grants programs
Group fr
Programmes de subventions à la découverte
Committee code
1510
Committee name en
Electrical and Computer Engineering
Committee name fr
Génie électrique et informatique
Area of application code
1211
Area of application group en
Advancement of knowledge
Area of application group fr
Avancement des connaissances
Area of application en
Medical and health sciences
Area of application fr
Sciences médicales et de la santé
Research subject code
2515
Research subject group en
Electrical and electronic engineering
Research subject group fr
Génie électrique et électronique
Research subject en
Electronic materials and components
Research subject fr
Matériels et composants électroniques
Partie
1
Nb partie
5
Application title
Amorphous semiconductors for optoelectronic applications: photoconductors, detectors and sensors based on se-alloys
Keyword
NSERC
Application summary
Amorphous semiconductors, such as hydrogenated amorphous silicon (a-Si:H) and its alloys, amorphous selenium (a-Se) and its alloys (a-Se:As) etc, have one clear distinct advantage over crystalline semiconductors that they can be conveniently fabricated over large areas, which has lead to their extensive commercial use in photovoltaics, flat panel displays (TFT displays), flat panel x-ray image detectors, and flexible electronics. Within the field of electronic and optoelectronic devices, amorphous semiconductors represent a particularly important niche in which Canada has a very strong and competitive presence. Our long term goals and objectives are to build on strength by expanding our scientific and technological knowledge on a-Se alloy based semiconductors and optoelectronic devices by innovation at the material level, innovation at the device level and advancing knowledge at the fundamental level. The design of next generation a-Se x-ray image detectors also needs extensive knowledge on the electrical properties of the photoconductor used in the three layers, e.g. charge carrier ranges, drift mobility x carrier lifetime, excess noise and thermal generation rate in each layer. To date, no one has examined the nature of electronic noise in a-Se p-i-n detectors and we intend to take this on as a major study. Our objectives and studies will include: (i) Discovering and understanding the electrical and optoelectronic properties of a-Se:As alloys as a function of temperature and electric field toward enhanced p-i-n structures with lower dark currents and higher applied fields; increasing the field will improve the DQE. (ii) Discovering the behavior of low-frequency (1/f) noise for better detector design. (iii) More stable compositions for the i-layer and p-layer through enhanced material properties from (i). (iv) Developing avalanche a-Se structures with multiplication, demonstrating their suitability for use in ultrasensitive optical imaging and in indirect radiation detection. The impact of the work is, of course, the generation of new knowledge on a-Se detectors, novel structures with new compositions, for the design and development of next generation a-Se x-ray detectors, and all solid state ultrasenstive optical image sensors.