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Grant: Research Tools and Instruments - Category 1 (<$150,000)

Queen's University

$65,244.00

Apparatus for studying the structure and evolution of atomically-ordered domain boundaries, kinks and vertexes

EF 2010-11

Résumé
In many classes of electronic materials, such as polycrystalline Si or high-k dielectrics, properties such as solar cell efficiency or breakdown field depend on the size and spatial arrangement of crystalline grains and the distribution of interfaces (microstructure). Materials are frequently annealed to initiate micro-structural transformation via re-crystallization and grain growth. Although, there is a large literature on grain grown and grain coarsening, in lieu of detailed crystallographic information about interfaces and interface energies, theoretical models normally assume that interface energies are isotropic. To go beyond this, it is necessary to classify interfaces according to their microstructure and this could lead to a quantitative understanding of the relationship between processing, structure and material properties. Consequently, we are excited by the fact that we have discovered a two-dimensional analog of a three-dimensional electronic material that has a highly anisotropic distribution of interfaces (domain boundaries) that is amenable to detailed investigation at the atomic level. Specifically, we have developed a way of growing a Ge film on an atomically flat Si surface so that it contains crystalline domains separated by atomically ordered boundaries. Using this model system it is possible to study: the distribution of domains, the distribution of boundaries, the atomic structure of boundaries and the temporal evolution of boundaries, kinks and vertexes. To take full advantage of this system we require electronics that will allow us to perform tunneling and force microscopy simultaneously. This will allow us accurately determine the position of atoms in the boundary region and also discriminate between Si and Ge atoms in many cases. These studies will provide atomic-level information about the physical factors that determine the anisotropic distribution of boundaries and the growth of domains in well-characterized model system. This apparatus will also provide novel training opportunities for six highly qualified personnel/year.
Programme
Research Tools and Instruments - Category 1 (<$150,000)
Bénéficiaire
Emplacement
Ontario, Canada
Type de bénéficiaire
Academia
Type
Grant
Source
NSERC's Awards Data

Tel que publié

Application id
389553-2010
Name nom
McLean, Alastair
Department département
Physics, Engineering Physics & Astronomy
Organization id
29
Institution établissement
Queen's University
Province en
Ontario
Province fr
Ontario
Country en
CANADA
Country fr
CANADA
Fiscal year exercice financier
2010
Competition year année de concours
2010
Award amount
65244
Program id
EQPEQ
Program name en
Research Tools and Instruments - Category 1 (<$150,000)
Program name fr
Outils et instruments de recherche - catégorie 1 (<150 000$)
Group en
Discovery grants programs
Group fr
Programmes de subventions à la découverte
Committee code
1505
Committee name en
Physics
Committee name fr
Physique
Area of application code
1202
Area of application group en
Advancement of knowledge
Area of application group fr
Avancement des connaissances
Area of application en
Physical sciences
Area of application fr
Sciences physiques
Research subject code
3300
Research subject group en
Condensed matterphysics
Research subject group fr
Physique de la matière condensée
Research subject en
Condensed matterphysics
Research subject fr
Physique de la matière condensée
Partie
1
Nb partie
1
Application title
Apparatus for studying the structure and evolution of atomically-ordered domain boundaries, kinks and vertexes
Keyword
NSERC
Application summary
In many classes of electronic materials, such as polycrystalline Si or high-k dielectrics, properties such as solar cell efficiency or breakdown field depend on the size and spatial arrangement of crystalline grains and the distribution of interfaces (microstructure). Materials are frequently annealed to initiate micro-structural transformation via re-crystallization and grain growth. Although, there is a large literature on grain grown and grain coarsening, in lieu of detailed crystallographic information about interfaces and interface energies, theoretical models normally assume that interface energies are isotropic. To go beyond this, it is necessary to classify interfaces according to their microstructure and this could lead to a quantitative understanding of the relationship between processing, structure and material properties. Consequently, we are excited by the fact that we have discovered a two-dimensional analog of a three-dimensional electronic material that has a highly anisotropic distribution of interfaces (domain boundaries) that is amenable to detailed investigation at the atomic level. Specifically, we have developed a way of growing a Ge film on an atomically flat Si surface so that it contains crystalline domains separated by atomically ordered boundaries. Using this model system it is possible to study: the distribution of domains, the distribution of boundaries, the atomic structure of boundaries and the temporal evolution of boundaries, kinks and vertexes. To take full advantage of this system we require electronics that will allow us to perform tunneling and force microscopy simultaneously. This will allow us accurately determine the position of atoms in the boundary region and also discriminate between Si and Ge atoms in many cases. These studies will provide atomic-level information about the physical factors that determine the anisotropic distribution of boundaries and the growth of domains in well-characterized model system. This apparatus will also provide novel training opportunities for six highly qualified personnel/year.